Large samples mechanical profilometer FP Series 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Toho Technology offers surface metrology solutions suitable for large samples (from 200 to 500mm). Using KLA measurement heads, FP series performance achieves sub-nanometric vertical accuracy. […]
Optical profilometer at the best quality / price FP Series 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Toho Technology offers surface metrology solutions suitable for large samples (from 200 to 500mm). Using KLA measurement heads, FP series performance […]
Optical profilometer for R&D FP Series 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Toho Technology offers surface metrology solutions suitable for large samples (from 200 to 500mm). Using KLA measurement heads, FP series performance achieves sub-nanometric vertical accuracy. […]
Automated optical profilometer, large sample FP Series 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Toho Technology offers surface metrology solutions suitable for large samples (from 200 to 500mm). Using KLA measurement heads, FP series performance achieves sub-nanometric vertical […]
Standards Calibration – Standard step FP Series 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Mechanical profilometry P17 : Mechanical profilometer for industry and R&D >> P7 : Mechanical profilometer best price/performance >> D600 : Mechanical submicron precision profilometer […]
Optical profilometer for industry FP Series 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Toho Technology offers surface metrology solutions suitable for large samples (from 200 to 500mm). Using KLA measurement heads, FP series performance achieves sub-nanometric vertical accuracy. […]
Profilometer for stress measurement FP Series 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Toho Technology offers surface metrology solutions suitable for large samples (from 200 to 500mm). Using KLA measurement heads, FP series performance achieves sub-nanometric vertical accuracy. […]
DHM microscope – Materials science FP Series 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Toho Technology offers surface metrology solutions suitable for large samples (from 200 to 500mm). Using KLA measurement heads, FP series performance achieves sub-nanometric vertical […]
DHM microscope – Life science FP Series 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Toho Technology offers surface metrology solutions suitable for large samples (from 200 to 500mm). Using KLA measurement heads, FP series performance achieves sub-nanometric vertical […]
Table Top scanning electron microscopes EM-30 Serie 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Toho Technology offers surface metrology solutions suitable for large samples (from 200 to 500mm). Using KLA measurement heads, FP series performance achieves sub-nanometric vertical […]
Standard scanning electron microscopes EM-30 Serie 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Toho Technology offers surface metrology solutions suitable for large samples (from 200 to 500mm). Using KLA measurement heads, FP series performance achieves sub-nanometric vertical accuracy. […]
SEM sample metallizer EM-30 Serie 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Toho Technology offers surface metrology solutions suitable for large samples (from 200 to 500mm). Using KLA measurement heads, FP series performance achieves sub-nanometric vertical accuracy. Toho’s […]