The solutions combine DHM with dedicated hardware, software and specific options to meet the needs of R & D innovative industrial applications.
DHM technology and products have been developed by Lyncée Tec, which also has the skill and flexibility to offer customization and OEM systems.
The DHM Reflection measures the wavefront reflected from the sample, i.e. the topography of the surface in case of pure reflection of the sample.
The DHM is more than a standard optical profilometer since it allows dynamic measurement in vertical ranges from nanometer to several hundred microns with vertical sub-nanometric resolution.
The DHM Transmission measures the optical path difference of a beam passing through samples.
For measurements of micro-optical components, microfluidic devices and faults or particles inside transparent samples, Transmission DHM systems are generally the optimal choice.
A new milestone has been reached in the field of ultrafast 3D topography measurements with the delivery to Professor James Friends, University California of San Diego, of a DHM T1000 equipped with a Photron Nova high speed camera enabling 12’500 3D topography Measurement Per Second (MPS) for a digital resolution of 1024×1024 pixels, and 116’000 MPS for 256×266 pixels …
The new industrial DHM® series R100 and R200 have been developed specifically for on-line quality control applications, and for integration on robot arms and gantry conveyors. The unique non-scanning acquisition DHM® technology provides 3D topography INSTANTANEOUSLY with an interferometric resolution. It is so fast that measurements can be acquired on-flight, and in the presence of environmental vibrations.