Scanning Electron Microscopes (SEM)
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Scanning Electron Microscopy (MEB in French or SEM in English for Scanning Electron Microscope) is an electron microscopy technique capable of producing 3-dimensional images of very high resolution on the order of a nanometer of the surface of a sample in using the principle of electron-matter interactions.
COXEM Standard Scanning Electron Microscopy (SEM) systems offer a wide range of functionality for higher magnification and multiple ports for additional analytical functionality such as EDS, EBSD, WDS, STEM, cold and sample transfer, etc.