SEM sample polisher CP-8000 1. Ionic polisher 2. Sample preparation 3. Preserves structures 4. Easy to use The cross-section polisher for the CP-8000 ion mill for SEM sample preparation uses a beam of argon ions to gently remove materials from the surface of a sample – literally atoms at a time. The resulting atomic level […]
EDS : Quantitative measurement of the elements Oxford EDS – Ultim® Max EDS with AZtecLive The Oxford Ultim® Max EDS series from Oxford Instruments is available in detector sizes of 40, 65, 100 or 170 mm² for the complete SEM CX-200plus using Oxford’s famous AZtecLive software platform for simple elemental micro-analysis or advanced. The more affordable […]
Atomic Force Microscope best cost/effective solution Nano-Observer 1. Best cost effective solution 2. High resolution and measurement quality 3. Advanced electrical modes, multiple modes and environments 4. Ease of use (software, side and top views) The Nano-Observer is a compact and powerful AFM microscope with an all-in-one scanner (large and high resolution scans in a […]
Advanced electrical modes for AFM Only available with the AFM Nano-Observer 1. HD-KFM : High Definition Kelvin Force Microscopy 2. ResiScope II : Current / Resistance over 10 decades 3. Soft ResiScope : ResiScope on delicate samples 5. sMIM : Permittivity and conductivity mapping at nm Microscopie AFM Nano-Observer : The best cost/effective AFM >> Environments […]
AFM Environments Always more possibilities with the AFM Nano-Observer 1. Environmental control: Gas, humidity 2. Liquid medium: No additional adjustment 3. Temperature control: From -35°C to 250°C AFM Microscopy Nano-Observer : The best cost/effective AFM >> Advanced electrical modes : HD-KFM, ResiScope, sMIM >> AFM Probes : With or without contact, electric, specific >> Need help? […]
AFM Probes Wide range of AFM probes ScienTec distributes a wide range of SPM tips for most AFM applications at an affordable price. We leverage our AFM experience to provide the highest quality tips using the latest technology on the market. Contact No Contact conductive EFM / MFM Diamand High resolution specific AFM Microscopy Nano-Observer […]