DHM Microscope for Industry DHM R100 & R200 1. Tailored for industrial applications 2. On-flight 3D measurement 3. Robust, compact, lightweight The industrial DHM® series R100 and R200 are compact and lightweight 3D optical profilometers with interferometric resolution. They can be mounted on robot arms and gantry conveyors, and can be easily integrated into special multifunctional […]
High speed – DHM Microscope High Speed DHM 1. High speed camera 2. Up to 12’800 frames per second (fps) at megapixel resolution 3. A dedicated and intuitive software interface 4. Operates with a single wavelength and can be configured in either transmission or in reflection 5. Enables novel research A new milestone has been […]
Nanoindenter at nanoscale G200 1. Accurate, flexible and user-friendly 2. Mechanical test at the nanometric scale 3. Scalable and extensible platform 4. Automated The G200 Nanoindenteur system is a precise, flexible and user-friendly instrument for mechanical testing at the nanometric scale. It is a fully scalable, scalable, production-proven platform with automated high-throughput hardness measurement […]
Nanoindentor up to 1 N force iMicro 1. Accurate, flexible and user-friendly 2. Wide range of nanomechanical tests 3. Hard materials, high loads, great depth (> 1N of force) The iMicro Nanoindenter is a precise, flexible and user-friendly instrument that allows a wide range of nanomechanical tests, including module and hardness (Oliver and Pharr, ISO […]
Nanoindenter up to 50 mN of force iNano 1. Accurate, flexible and user-friendly 2. Wide range of nanomechanical tests 3. Thin films and soft materials (> 50 mN of force) The INano Nanoindenter is a precise, flexible and user-friendly instrument allowing a wide range of nanomechanical tests, including the module and the hardness (Oliver […]
Universal Test Machine T150 UTM 1. Complete means of nanomechanical characterization 2. Simple fibers, biomaterials and polymers 3. Wide dynamic range & high resolution The T150 UTM tensile tester provides users with a complete nanomechanical characterization tool for the study of simple fibers, biomaterials and polymers. Thanks to its wide dynamic range and high […]
Ambient & Vacuum Nanoindentor NanoFlip 1. Ambient conditions, under vacuum 2. Hardness, young’s modulus, elastic limit and other nanomechanical tests 3. In situ test The NanoFlip nanoindentor measures hardness, modulus, yield strength and other nanomechanical tests under ambient and vacuum conditions. The vacuum compatible NanoFlip performs in situ testing in scanning electron microscope (SEM) […]
Reflectometers Adaptable to microscope F40 1. Spot as small as 1 micron 2. Connection to the simple microscope 3. Precise monitoring of the measuring point 4. Wide measuring range The F40 family of products is intended for applications requiring a spot size as small as 1 micron. For most microscopes, the F40 simply connects to […]
Nanoindentor for High temperature InSEM HT 1. Mechanical properties at high temperature under vacuum 2. Deformations in real time, 3. Compatible with scanning electron microscope (SEM) and focused ion beam (FIB) chambers, or autonomous vacuum chambers The KLA InSEM® HT (high temperature) test system allows mechanical properties to be tested at high temperature under vacuum […]
Spot measurement F20 1. Simple configuration from 10,000 € 2. 10Å to 10mm 3. Quick measurement 4. Wide measuring range The F20, F10 and F3 are general purpose film thickness measuring instruments and are used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. Like all our […]
Automated thin-film thickness mapping F50 1. Quick mapping 2. Sample up to 450mm in diameter 3. Many card models 4. Customizable 5. Automated The Filmetrics F50 family of products can map film thickness as quickly as two dots per second. A motorized R-Theta stage accepts standard and personalized mandrels for samples up to 450 mm […]
Multi-site / In-situ reflectometers F30 1. Significantly improves productivity 2. best value for money 3. Fast and precise 4. Easy to use 5. Turnkey system The most powerful tool available to monitor the deposition of thin layers Measure deposition rates, film thickness, optical constants (n and k) and uniformity of semiconductors and dielectric layers in […]