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Vous êtes ici : Accueil > Surface Analysis > MFP-3D Origin AFM

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MFP-3D Origin AFM

The MFP-3D Origin™ features Asylum Research performance and quality at a price competitive with most low-cost AFMs. Origin marks the intersection of performance and affordability and offers high-resolution imaging, supports large samples, most imaging modes, and many accessories. It's simply the best place to start with AFM!

  • Easily the best research-grade AFM at this low price point
  • High performance—a single scanner scales from atomic resolution to huge 120 µm scans
  • Ease of use and a rugged, reliable design make it great for busy labs
  • Modes and accessories that take you beyond topography
  • Easily upgradable for additional functionality
  • Unmatched customer support worldwide
Features and Benefits Operating Modes
Features and Benefits

Ease of use and a rugged design make it great for busy labs

  • SmartStart™ automatically detects and configures system components to get results quickly
  • ModeMaster™ automatically configures software for selected mode
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • GetStarted™ automatically sets optimal parameters for tapping mode imaging

Modes and accessories that take you beyond topography

  • Nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Large range of nanoelectrical and electromechanical characterization modes
  • Temperature control for heating samples to 275°C
  • Controlled gas or liquid environment options that are simple, safe and effective

Support that goes above and beyond your expectations

  • Includes a standard one-year comprehensive warranty
  • No-charge technical support and basic applications support for life
  • Affordable support agreements that offer extended warranties and advanced training
  • Easy upgrade path to the MFP-3D Origin+ or MFP-3D Infinity
Operating Modes

Included Operating Modes

Contact mode
DART PFM
Dual AC™
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

 

Optional Operating Modes

AM-FM Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
Scanning Thermal Microscopy (SThM)
Scanning Tunneling Microscopy (STM)

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