Cutting-Edge Atomic Force Microscope for Advanced Research
Nano-Observer II
1. Exceptional performance for cutting-edge research
2. Ultra-high resolution and unmatched measurement precision
3. Complete suite of advanced electrical modes and extensive environmental compatibility
4. Intuitive user interface with advanced automation
The Nano-Observer II is a premium AFM microscope offering unprecedented measurement capabilities. Its innovative scanner allows for large-scale and high-resolution analyses without compromise. In addition to standard modes, it offers a full range of advanced modes, including HD-KFM III, ResiScope III, and VMFM (Variable Magnetic Field Module). The Nano-Observer II excels in various environments (precise control of gases, humidity, temperature, and liquid measurements). Its extended optical capabilities make it an ideal tool for advanced couplings (TERS, correlative techniques). Highly customizable, it meets the most demanding requirements of modern research.
AFM Microscopy
Applications for Atomic Force Microscopy
- Chemistry
- Coating / thin layers
- Life sciences
- Science of materials
- Micro / Nanostructures
- Optical
- Polymers
- Semiconductors
Cobalt alloy coating, MFM mode, 30µm
Carbon Fibers in epoxy, Force modulation mode, 30µm
PZT, PFM mode, 10µm
OPV, ResiScope mode, 10µm
Spherulites, oscillating mode, 20µm
AU, Soft ResiScope mode, 5µm
Biomolecules, HD-KFM mode, 1µm
More info on Applications
The AFM Nano-Observer microscope, a complete configuration
1. Ease of use
- Top and side view
- Intuitive software
- Touch screen control
2. High resolution with a large scanner
- Low noise laser and electronics
- 24bit controller
- Patented bending stage
3. Multiple modes
- Contact / Friction and oscillation mode / Phase
- Driver AFM
- PFM (Piezo-response)
- MFM / MLFM / EFM
- Modulation force
4. UNIQUE electrical modes
- HD-KFM
No lift: better sensitivity and resolution
- ResiScope
Current / resistance from 10 ^ 2 to 10 ^ 12 ohms
- Soft ResiScope
ResiScope for delicate samples
- sMIM
permittivity and conductivity at the nm scale
5. Various environments
- Controlled atmosphere (gas, humidity)
- Temperature (-40 to 200 ° C)
- Liquid (no adjustment required)
Nano-Observer Advantages
- High resolution and ease of use
- Low noise laser and pre-alignment system
- The ultimate in electrical measurement in AFM
- Several environments (liquid, gas, temperature)
- Affordable
- Upgradable
Specifications
Specifications
| XY scan range | |
|---|---|
| Z range | 10 μm (tolerance +/- 10%) |
| XY drive resolution | 24 bit control - 0.06 Angströms |
| Z drive resolution | 24 bit control - 0.006 Angströms |
| Ultra low noise HV | Typ : <0.01 mV RMS |
| 6 DAC Outputs | 6 D/A Converters – 24 bit (XYZ drive, bias, aux…) |
| 8 ADC Inputs | 8 A/D Converters – 16 bit |
| Data points | Up to 4096 |
| Integrated Lock-in |
Up to 6 MHz (software limited) 2nd lock-in (6 MHz-optional) |
| Interface | USB (2.0 - 3.0 compatible) |
| Controller Power | AC 100 – 240 V - 47-63 Hz |
| Operating System | Windows XP, 7, 8 or 10 |
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