Photometry -Colorimetry

Scanning Probe Microscopy 

Agilent Technologies

- AFM/STM

- Large sample AFM

- Biology application AFM

CSInstruments

- Nano-Observer AFM

- ResiScope current and resistance measurements

Nanonics

-Microscopy SNOM

Accessoires

- AFM Probes

2D/3D optical profilometry

KLA Tencor

- Interferometer

Toho Technology

- Stress measurement

Sensofar

- Interferometer

- Interferometer/ confocal

Lyncee Tec

- 3D dynamic holography

Mechanical Profilometry

KLA Tencor

- Profilometer

Measurement of light sources and monitors

Konica Minolta

- Luxmeter

- Luxmeters/ Chromameters

- Photometers/ chromameters

- Spectro-radiometers

- Videocolorimeters

- Screen Analyzers

Gooch & Housego

- Photometers radiometers

- Light source

- Spectroradiometers

TechnoTeam

- Video-photometers / colorimeters

Jeti

- Spectroradiometers

Nano-Indentation

Agilent Technologies

- Nano-Indenter

Nanmechanics

- In-Situ Indentation

Thin film

Filmetrics

- Spectrale measurement

- Measurement of thickness

- Optical constant

Photovoltaic measurement

Konica Minolta

- Reference PV cells

Field Emmission Scanning Electron Microscopy

Agilent Technologies

- FE-SEM