Products


Surface analysis

Photometry -Colorimetry

 

Scanning Electron Microscopy
 


Coxem

- EM-30AX Plus (SEM)

- EM-30AX (SEM)

- EM-30 Plus (SEM)

- EM-30 (SEM)

- CX-200TM (SEM)

- CX-200TA (SEM)

- Ion Coater (SEM sample)

- EDS Options

 

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Scanning Probe Microscopy
 


CSInstruments

- Nano-Observer AFM

- ResiScope current and resistance measurements

 

Nanonics

-Microscopy SNOM

 

Accessoires

- AFM Probes

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2D/3D optical profilometry


KLA Tencor

- Interferometer

 

Toho Technology

- Stress measurement


Sensofar

- Interferometer

- Interferometer/ confocal
- Inspection stents

Lyncee Tec

- 3D dynamic holography

- Wafer inspection

- MemsTool

- Reflectometer

 

Filmetrics

- Optical profilometer

 

Accessories

- Calibration standards

 

 

 

 

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Measurement of light sources and monitors


Konica Minolta

- Luxmeter

- Luxmeters/ Chromameters

- Photometers/ chromameters

- Spectro-radiometers

- Videocolorimeters

- Screen Analyzers

 

Optronic Laboratories

- Photometers radiometers

- Light source

- Spectroradiometers

 

TechnoTeam

- 2D Photometer

- Video-photometers
- Video-colorimeters

 

Jeti

- Spectroradiometers

- Spectroradiometers UV

 

 


Vacuum Technology

 

Prevac

- Ultra High Vacuum systems

- Manipulators, goniometer...

- Chamber
- Sample holders

- Instruments

- Accessories
- Electronics

- Software



Spectroscopy (IR & Raman)

 

Photothermal spectroscopy corp (Infra-Red)

- mIRage (sub-µm IR spectroscopy)

 

S&I ( Raman)

- Monovista

- Triple-Spectrometer

 

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Thin film

 

Filmetrics

- Spectrale measurement

- Measurement of thickness

- Optical constant

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Nano-Indentation

 

KLA Tencor

- In-Situ Indenter
- Nano-Indenter iNano
- Nano-Indenter iMicro
- Nano-Indenter (Ambient & Vacuum)

- Nano-Indenter G200
- T150 UTM
- NanoSuite


 




Mechanical Profilometry

 

KLA Tencor

- Profilometer

- Simulator stylus / channels


Toho Technology

- Profilometer large sample

 

Accessories

- Calibration standards