Products


 

Surface analysis  

Photometry -Colorimetry

 

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Scanning Probe Microscopy
 


CSInstruments

- Nano-Observer AFM

- ResiScope current and resistance measurements

 


Anasys Instruments

- NanoIR2 (AFM+IR)

- NanoIR2-s (AFM-IR+SNOM)


 

Nanonics

-Microscopy SNOM

 

Accessoires

- AFM Probes

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2D/3D optical profilometry


KLA Tencor

- Interferometer

 

Toho Technology

- Stress measurement


Sensofar

- Interferometer

- Interferometer/ confocal


- Inspection stents

Lyncee Tec

- 3D dynamic holography

 

- MemsTool

 

- Reflectometer

 

Filmetrics

- Optical profilometer

 

Accessories

- Calibration standards

 

 

 

 

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Measurement of light sources and monitors


Konica Minolta

- Luxmeter

- Luxmeters/ Chromameters

- Photometers/ chromameters

- Spectro-radiometers

- Videocolorimeters

- Screen Analyzers

 

Gooch & Housego

- Photometers radiometers

- Light source

- Spectroradiometers

 

TechnoTeam

- 2D Photometer

- Video-photometers


- Video-colorimeters

 

Jeti

- Spectroradiometers

- Spectroradiometers UV

 

 

 

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Nano-Indentation

 

Nanomechanics

- In-Situ Indenter

- Nano-Indenter


- Nano-Indenter (Ambient & Vacuum)

 




Mechanical
Profilometry

 

KLA Tencor

- Profilometer


Toho Technology

- Profilometer large sample

 

Accessories

- Calibration standards

 
 

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Thin film

 

Filmetrics

- Spectrale measurement

- Measurement of thickness

- Optical constant


Vacuum Technology

 

Prevac

- Ultra High Vacuum systems

- Manipulators, goniometer...

- Chamber


- Sample holders

- Instruments

- Accessories


- Electronics

- Software


 

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Photovoltaic measurement

 

Konica Minolta

- Reference PV cells