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The nanoIR2-FS is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications. The system also provides IR-based chemical imaging to provide mapping of chemical variations of the feature of interest. Unique Point Spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.
Polyethersulphone (PES)
Spectral assignments: S = O sym. stretch:1152,1295, CSO2C asym. stretch: 1320, C-O asym. stretch: 1000-1240, Benzene ring stretch: 1485, 1578, Carbonyl: 1731
10nm chemical imaging spatial resolution with Tapping AFM-IR "The nanoIR2 is a go-to tool for unique nanoscale IR analysis, and has solved many problems to the delight of our academic and industrial users." The University of Delaware purchased the nanoIR2 in a multiuser facility which I manage. Once the instrument was available to my users, it became a go to tool for unique IR analysis. The nanoIR2 has proved to be a very robust platform with great stand-alone AFM capabilities. The user interface is clear and very intuitive, and the software never crashes. Many problems in manufacturing and failure analysis have been solved or identified to the delight of my industrial users. I look forward to many more years of satisfying use of the Anasys nanoIR2". |
Tapping AFM-IR images show lenticular crystals; overall thickness (50 nm) indicates multilayer crystals. Characteristic IR absorption band of PHBHx. The band shape between 1700-1760 cm-1 reveals fairly similar crystallinity at different sites. An absorption band at 1510 cm-1 is also observed, indicating presence of aromatic moiety, not observed for 3.9 mol% sample. |
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Wide range of AFM-IR applications with spatial resolution down to 25nm and <10nm sensitivity
Chemical analysis of semiconductor devices
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Interface analysis of composites
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Organic nanocontaminant on metal surface
Spectra collected using the resonant enhanced mode allows identification of nanoscale organic contamination on a magnetic disk. This particle has dimensions of approximately 100 nm x 200 nm x 28 nm. |
Microtomed toner particle
Toner particles are a complex mixture of multiple components, the nanoIR allows identification and localization of these components with nanoscale resolution. |
hydrocarbons on minerals
AFM topography (L) and IR absorption image (R) showing location of hydrocarbons as detected by the CH stretch absorption. |
Thin polymer film
The resonance enhanced mode enables high quality measurements on very thin films. A 20 nm film on PMMA taken by the nanoIR |
Wide range of AFM-IR applications with spatial resolution down to 25nm and <10nm sensitivity
Every product in the Anasys Instruments family is built around our full featured AFM supporting many routinely used AFM imaging modes. These include tapping, phase, contact, force curves, lateral force, force modulation, EFM, MFM, CAFM and more.
Tapping image of block copolymer |
Force modulation of polymer blend |
KPFM Image on Nanocomposite sample composed of graphene oxide and polymeric material |
Tapping phase image of polymer nanocomposite |
Broadband nanomechanical spectra utilizing Lorentz Contact Resonance (LCR) provides rich information about variations in material stiffness, viscosity and friction. LCR provides sensitive material contrast on materials ranging from soft polymers to hard inorganics and semiconductors.
Nanomechanical spectra (left) discriminate materials on the basis of stiffness and damping. Examples of LCR stiffness maps
on complex polymer blends (center) and high performance paper products (right).
Developed by Anasys Instruments, this award-winning technology uses Anasys ThermaLever™ probes to locally ramp the sample’s temperature to measure and map thermal transitions and other thermal properties
Left: nanoTA uses a heated AFM tip to measure glass transition and melt temperatures with nanoscale spatial resolution. Middle: Thermal transition curves on a 21 layer laminated polymer film. Right: Scanning thermal microscopy visualizes variations in temperature and thermal conductivity on a sectioned circuit board.
nanoIR measurements on a carbon fiber-epoxy composite revealing variations in chemical composition across the fiber/epoxy interface. This measurement was performed on a polished bulk sample.
