NanoIR2-FS

NanoIR2-FS

New sub-10 nanoscale IR spectroscopy based on tapping AFM-IR

 

AFM IR

 


 

AFM IR

 

 

 

  • True model free nanoscale IR absorption spectroscopy
  • 10nm resolution chemical imaging with Tapping AFM-IR
  • FAST spectra AFM-IR provides high resolution, nanoIR spectroscopy in seconds
  • Rich, interpretable IR spectra that directly correlates to FTIR
  • Correlative microscopy with nanoscale property mapping and full featured AFM
  • "Anasys engineered” for Ease of Use, productivity and reliability

     

 


New nanoIR2-FS with FASTspectra™ technology


AFM IR

 

The nanoIR2-FS is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications. The system also provides IR-based chemical imaging to provide mapping of chemical variations of the feature of interest. Unique Point Spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.

 

AFM IR

 

Polyethersulphone (PES)
Spectral assignments: S = O sym. stretch:1152,1295, CSO2C asym. stretch: 1320, C-O asym. stretch: 1000-1240, Benzene ring stretch: 1485, 1578, Carbonyl: 1731

 

Rich, interpretable FTIR spectra


AFM IR

10nm chemical imaging spatial resolution with Tapping AFM-IR

"The nanoIR2 is a go-to tool for unique nanoscale IR analysis, and has solved many problems to the delight of our academic and industrial users."

The University of Delaware purchased the nanoIR2 in a multiuser facility which I manage. Once the instrument was available to my users, it became a go to tool for unique IR analysis. The nanoIR2 has proved to be a very robust platform with great stand-alone AFM capabilities. The user interface is clear and very intuitive, and the software never crashes. Many problems in manufacturing and failure analysis have been solved or identified to the delight of my industrial users. I look forward to many more years of satisfying use of the Anasys nanoIR2".

AFM IR

Tapping AFM-IR images show lenticular crystals; overall thickness (50 nm) indicates multilayer crystals. Characteristic IR absorption band of PHBHx. The band shape between 1700-1760 cm-1 reveals fairly similar crystallinity at different sites. An absorption band at 1510 cm-1 is also observed, indicating presence of aromatic moiety, not observed for 3.9 mol% sample.
Data courtesy of Rabolt et. al, University of Delaware

 

 

AFM-IR Applications


AFM IR

Wide range of AFM-IR applications with spatial resolution down to 25nm and <10nm sensitivity

Chemical analysis of semiconductor devices

AFM IR
nanoIR measurements on layers in a semiconductor device. The analysis reveals variations in chemical composition not measurable by conventional IR microscopy.

Interface analysis of composites

AFM IRnanoIR measurements on a carbon fiber-epoxy composite revealing variations in chemical composition across the fiber/epoxy interface. This measurement was performed on a polished bulk sample.

Organic nanocontaminant on metal surface

AFM IR

Spectra collected using the resonant enhanced mode allows identification of nanoscale organic contamination on a magnetic disk. This particle has dimensions of approximately 100 nm x 200 nm x 28 nm.

Microtomed toner particle

AFM IR

Toner particles are a complex mixture of multiple components, the nanoIR allows identification and localization of these components with nanoscale resolution.

hydrocarbons on minerals

AFM IR

AFM topography (L) and IR absorption image (R) showing location of hydrocarbons as detected by the CH stretch absorption.

Thin polymer film

AFM IR

The resonance enhanced mode enables high quality measurements on very thin films. A 20 nm film on PMMA taken by the nanoIR

 

 

Correlated property mapping with nanoscale topographical, chemical, mechanical, electrical, and thermal analysis capabilities


AFM IR

 

Wide range of AFM-IR applications with spatial resolution down to 25nm and <10nm sensitivity

 

Every product in the Anasys Instruments family is built around our full featured AFM supporting many routinely used AFM imaging modes. These include tapping, phase, contact, force curves, lateral force, force modulation, EFM, MFM, CAFM and more.

AFM IR

Tapping image of block copolymer
Force modulation of polymer blend
KPFM Image on Nanocomposite sample composed of graphene oxide and polymeric material
Tapping phase image of polymer nanocomposite

 

Broadband nanomechanical spectra utilizing Lorentz Contact Resonance (LCR) provides rich information about variations in material stiffness, viscosity and friction. LCR provides sensitive material contrast on materials ranging from soft polymers to hard inorganics and semiconductors.

AFM IR

Nanomechanical spectra (left) discriminate materials on the basis of stiffness and damping. Examples of LCR stiffness maps
on complex polymer blends (center) and high performance paper products (right).

 

Developed by Anasys Instruments, this award-winning technology uses Anasys ThermaLever™ probes to locally ramp the sample’s temperature to measure and map thermal transitions and other thermal properties

AFM IR

Left: nanoTA uses a heated AFM tip to measure glass transition and melt temperatures with nanoscale spatial resolution. Middle: Thermal transition curves on a 21 layer laminated polymer film. Right: Scanning thermal microscopy visualizes variations in temperature and thermal conductivity on a sectioned circuit board.

 

 

 

Further information


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