Nano-Observer Atomic Force Microscope, Microscope à Force Atomique

Nano-Observer AFM

Best cost effective solution !


 

News : Affordable AFM at your fingertips

Flexible and powerful AFM

 

Discover also the AzoNano Article by Stuart Milne.

 

 


dThe Nano-Observer is a flexible and powerful AFM microscope. Designed with the ultimate technologies, it combines performance and ease of use. The USB controller offers a real integrated lock-in for better measurement capability (phase detection, Piezo-Response Mode…). A low-noise laser and a pre-alignment system provide simplicity and high resolution on a compact AFM head. Its intuitive software simplifies all AFM settings to allow quick and safe AFM acquisitions.

 

Compact and robust, the Nano-Observer fulfills the requirements for advanced users or beginners. It avoids laser alignment with the pre-positioned tip system. A top and side view of the tip/sample, combined with vertical motorized control, makes the pre-approach easy. Easy positioning can be done by combining the optical access with the X-Y translation stage.

 

 


Applications


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Multiple Modes


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New AFM modes :

  • HD KFM
  • Soft ResiScope
  • Environments
    • EZ Temp
    • EZ liquids
    • Environment control
  • MFM / EFM
  • Conductive AFM
  • RESISCOPE (Current/Resistance over 10 decades)
  • PFM (Piezo-response)
  • Contact/Friction
  • Oscillating mode/Phase

 

Specific Electrical Modes (HD KFM, ResiScope & Soft ResiScope)


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HD KFM (Kelvin Force Microscopy)

 

 

ResiScope II (Resistance over 10 decades)

Resistance image, Scan size 5 μm x 5 μm,
Local Oxidation Nanolithography (LON) patterns, obtained on a 10 nm thick titanium layer deposited onto alumina substrate. Courtesy of Angel Perez. Institute of Materials Science of Barcelona (ICMAB – CSIC)
Resistance signal,Contact mode, Scan size: 50×50 microns. RAM memory Resistance signal, scan size 5µm, Organic Solar Cell

 

 

 

 

Soft ResiScope (True Quantitative Resistance/ Current Measurements with Intermittent Contact)

 



Soft Resiscope Principle

 

 

 

 

Quality measurements


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Low noise laser and electronics to achieve high resolution

 

 

 

 

 

Structure of the Flexstage (patented)

 

 

 

Resolution / sharpness

 

Left Topography, 3μm x 3μm, Middle : Phase signal: 3μm x3μm, Right: phase signal : 1μm x 1μm, Nano-Donuts Fluoroalkanes F14H20 on Si

opography signal, Scan size 3µm x 3µm, Graphene Topography signal, Scan range 5µm x 5µm, Mono atomic steps on SrTiO3 film Topography signal, Scan range 150nm x 150nm, C36 molecules deposited on HOPG

 

 

Integrated lock-in = Sensitive Phase contrast

 

Topography and phase signals, Polymers (PDES) – 12µm scan Topography and phase signals Graphene sample 10µm scan

 

 

 

Environments


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Environmental control

 

 

 

 

 

 

 

 

EZ Temp

Temperature : 70°C to 40°C, Resonant mode, PCL (polycaprolactone) crystallization under temperature control , Scan size : 20µm

 

 

EZ Liquids

 

Topography signal, scan size 80µm x 80µm Embryonic Fibroblast cell DNA circles deposited on mica

 

 

Multiple modes


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Electric Field Microscopy (EFM)

A very accurate lock-in for optimized phase measurements

 

Top Topography, 65μm x 65μm, Bottom : Phase signal: 65μm x65μm, Right: phase signal : 15μm x 15μm, Nanotubes «network» deposited between two electrodes (positive and negative bias).

Topography and EFM signals on gold Electrodes, 60µm scan

 

 

 

Magnetic Field Microscopy (MFM)

A very accurate lock-in for optimized phase measurements

 

Artificial Spin Ice 6.5µm scan Sample courtesy of P. Vavassori, Nanogune – SPAIN

Topography and MFM signals Scan range 4.5µm x 4.5µm Magnetic triangles structures

 

 

 

 

Conductive AFM

Current signal Scan range 35µm x 35µm, Semiconductor. Current signal Scan size : 3µm x 3µm, ITO

 

 

 

Force modulation

Topography and Phase signals, Scan size 25µm x 25 µm, Block Polymer

 

 

Piezo Force Microscope (PFM)

Topography and Amplitude signals, scan size 2.5µm*2.5µm, ZnO

 

Ease of use


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Top view for tip/sample positioning

A video color camera is provided with the AFM offering an helpful viewing from the top for tip/sample positioning or side view to make the tip/sample approach easier.

 

Side View

High performance optic (option)

A high performance optic (option) is also available to localize small features on your sample.

 

 

 

 

 

 

 

 

Intuitive software

Only main parameters are displayed for a clean and simple interface software

  • AFM Mode choice in one click
  • Autoset of the controller ! (no cables or module to mount or remove)
  • Pre-configured software (auto settings of most of the parameters)
  • AFM adjustment by “Steps” : the user can follow defined “steps” to set easily the AFM.

 

 

 

 

 

Specifications


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XY Scan range 100µm (tolerance +/- 10%)
Z range 9µm ( tolerance +/- 10%)
XY drive resolution 24 bit control - 0.06 Angströms
Z drive resolution 24 bit control – 0.006 Angströms
Z noise level <0.05nm RMS
Reduced coherence laser Wavelenght 658 nm – power < 1mW
Color optical view system Top and side view
6 DAC Outputs 6 D/A Converters – 24 bit
8 ADC Inputs 8 A/D Converters – 16 bit
Data points Up to 4096
Integrated Lock-in (Oscillating mode & phase) Up to 5 MHz
Interface USB 2.0
Controller size - weight 8 cm x 20 cm x 26 cm - 2 kg
Power AC 100 – 240 V 47-63 Hz
Operating System Windows XP (SP3 & Framework.NET 3.5 SP1) or Windows 7 (32/64bit)


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