{"id":4426,"date":"2019-12-19T12:59:11","date_gmt":"2019-12-19T11:59:11","guid":{"rendered":"https:\/\/www.scientec.fr\/surface-analysis\/reflectometers-and-thickness-measurement\/"},"modified":"2022-05-02T09:42:13","modified_gmt":"2022-05-02T07:42:13","slug":"reflectometers-and-thickness-measurement","status":"publish","type":"page","link":"https:\/\/www.scientec.fr\/en\/surface-analysis\/reflectometers-and-thickness-measurement\/","title":{"rendered":"Reflectometers and thickness measurement"},"content":{"rendered":"\n\n\t

Reflectometers and thickness measurement\n<\/h1>\nThin-film reflectometry measurement systems make it possible to measure reflectance, thickness and optical indices of single- and multi-layer deposition quickly and with high precision. With Filmetrics \/ KLA equipment, Scientec offers a wide range of single \/ multiple measurement solutions, online, adapted on microscope or in situ.
\n10\u00c5 \u00e0 10mm? Aucun probl\u00e8me<\/strong>
\nWith one click, you can measure and deduce the reflectance spectrum the thickness of a thin film by analyzing how the film reflects light. By measuring light not visible to the human eye, films as thin as 1 nm and as thick as 13 mm can be measured ….
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Spot measurement<\/a><\/strong><\/h2>\n\t\t\t\t\n\t\t\t\t\"F20\"\n\t\t\t\t<\/a>\n\t

Simple configuration from 10,000 \u20ac<\/strong><\/p>\n

F20\/ F10\/ F3 ><\/a><\/p>\n

 <\/p>\nHigh thickness measurement up to 15mm<\/strong>\nF70 ><\/a>\n

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Adaptable to microscope<\/a><\/strong><\/h2>\n\t\t\t\t\n\t\t\t\t\"F40\"\n\t\t\t\t<\/a>\n\t

Ideal for measuring ultra fine patterns or films<\/strong><\/p>\n

F40 ><\/a><\/p>\n

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Automated mapping<\/a><\/strong><\/h2>\n\t\t\t\t\n\t\t\t\t\"F50\"\n\t\t\t\t<\/a>\n\t

Customizable<\/strong> thickness mapping – best cost\/effective<\/strong> solution F50 ><\/a><\/p>\n

 <\/p>\nFine spot<\/strong> size – sample up to 450mm<\/strong> in diameter – R&D<\/strong>.\u00a0 F54 ><\/a>\n

 <\/p>\nAcoustic<\/strong> protection cover – Production<\/strong>.\u00a0 F54-XY-200 ><\/a>\n

 <\/p>\nHigh automation<\/strong> – notch<\/strong> detection – SECS \/ GEM<\/strong> interface.\u00a0F60 ><\/a>\n\t

Multi-site \/\u00a0
\nIn-Situ<\/a><\/strong><\/h2>\n\t\t\t\t\n\t\t\t\t\"Inline-monitoring-f30\"\n\t\t\t\t<\/a>\n\t

Perfectly suited to metrology in production <\/strong><\/p>\n

F30 ><\/a><\/p>\n

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Reflectometers and thickness measurement Thin-film reflectometry measurement systems make it possible to measure reflectance, thickness and optical indices of single- and multi-layer deposition quickly and with high precision. With Filmetrics \/ KLA equipment, Scientec offers a wide range of single \/ multiple measurement solutions, online, adapted on microscope or in situ. 10\u00c5 \u00e0 10mm? Aucun […]<\/p>\n","protected":false},"author":3,"featured_media":0,"parent":4409,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":{"0":"post-4426","1":"page","2":"type-page","3":"status-publish","5":"entry","6":"has-post-thumbnail"},"acf":[],"yoast_head":"\nReflectometers and thickness measurement - Scientec<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.scientec.fr\/en\/surface-analysis\/reflectometers-and-thickness-measurement\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Reflectometers and thickness measurement - Scientec\" \/>\n<meta property=\"og:description\" content=\"Reflectometers and thickness measurement Thin-film reflectometry measurement systems make it possible to measure reflectance, thickness and optical indices of single- and multi-layer deposition quickly and with high precision. 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