{"id":4415,"date":"2019-12-19T11:41:02","date_gmt":"2019-12-19T10:41:02","guid":{"rendered":"https:\/\/www.scientec.fr\/surface-analysis\/scanning-electron-microscopes\/"},"modified":"2022-05-02T09:42:47","modified_gmt":"2022-05-02T07:42:47","slug":"scanning-electron-microscopes","status":"publish","type":"page","link":"https:\/\/www.scientec.fr\/en\/surface-analysis\/scanning-electron-microscopes\/","title":{"rendered":"Scanning Electron Microscopes"},"content":{"rendered":"\n\n\t<h1>Scanning Electron Microscopes (SEM)<br \/>\n<\/h1>\n<p>Scanning Electron Microscopy (MEB in French or SEM in English for Scanning Electron Microscope) is an electron microscopy technique capable of producing 3-dimensional images of very high resolution on the order of a nanometer of the surface of a sample in using the principle of electron-matter interactions.<\/p>\n<p>&nbsp;<\/p>\nThe COXEM EM-30 table MEB series offers a wide range of features to meet the needs of scientific research and microscopic examination. COXEM is the only table MEB supplier offering both tungsten and CeB6 (cerium hexiumg\u00e9ride) electron sources, which allows us to recommend the best solution for your needs.\n<br \/>\nCOXEM Standard Scanning Electron Microscopy (SEM) systems offer a wide range of functionality for higher magnification and multiple ports for additional analytical functionality such as EDS, EBSD, WDS, STEM, cold and sample transfer, etc.\u00a0\n<p>&nbsp;<\/p>\nCoxem also offers MEB accessories for sample preparation such as the metalliser or the cross polisher.\n\t<h2><a href=\"\/?p=3967\">Table Top Scanning Electron Microscopes<\/a><br \/>\n<\/h2>\n\t\t\t\t<a href=\"http:\/\/www.scientec.fr\/en\/produit\/microscopes-electroniques-a-balayage-de-table\/\" target=\"_self\" itemprop=\"url\" rel=\"noopener\">\n\t\t\t\t<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/www.scientec.fr\/wp-content\/uploads\/2018\/12\/meb-30ax-plus.jpg\" alt=\"Meb-30ax plus\" itemprop=\"image\" height=\"500\" width=\"785\" title=\"Meb-30ax plus\" onerror=\"this.style.display='none'\"  \/>\n\t\t\t\t<\/a>\n\t<p><a href=\"http:\/\/www.scientec.fr\/en\/produit\/microscopes-electroniques-a-balayage-de-table\/\">SEM microscopes EM-30 series &gt;<\/a><\/p>\n<p>&nbsp;<\/p>\n&nbsp;<br \/>\n&nbsp;<br \/>\n&nbsp;\n\t<h2><a href=\"\/?p=4014\">Standard Scanning Electron Microscopes<\/a><br \/>\n<\/h2>\n\t\t\t\t<a href=\"http:\/\/www.scientec.fr\/en\/produit\/microscopes-electroniques-a-balayage-standard\/\" target=\"_self\" itemprop=\"url\" rel=\"noopener\">\n\t\t\t\t<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/www.scientec.fr\/wp-content\/uploads\/2018\/12\/meb-cx-200tm.jpg\" alt=\"Meb-cx-200tm\" itemprop=\"image\" height=\"500\" width=\"785\" title=\"Meb-cx-200tm\" onerror=\"this.style.display='none'\"  \/>\n\t\t\t\t<\/a>\n\t<p><a href=\"http:\/\/www.scientec.fr\/en\/produit\/microscopes-electroniques-a-balayage-standard\/\">SEM microscopes CX-200 series &gt;<\/a><\/p>\n<p>&nbsp;<\/p>\n&nbsp;<br \/>\n&nbsp;<br \/>\n&nbsp;\n\t<h2>Scanning electron microscopy accessories<br \/>\n<\/h2>\n\t\t\t\t<img decoding=\"async\" src=\"http:\/\/www.scientec.fr\/wp-content\/uploads\/2018\/11\/resultat3-microscope-electronique-balayage-1.jpg\" alt=\"resultat3-microscope-electronique-balayage\" itemprop=\"image\" title=\"resultat3-microscope-electronique-balayage\" onerror=\"this.style.display='none'\"  \/>\n\t<p><a href=\"http:\/\/www.scientec.fr\/en\/produit\/metalliseur-pour-echantillon-meb\/\">Metallizer &gt;<\/a><\/p>\n<p><a href=\"http:\/\/www.scientec.fr\/en\/produit\/polisseur-pour-echantillon-meb\/\">Cross Polisher &gt;<\/a><\/p>\n<p><a href=\"http:\/\/www.scientec.fr\/en\/produit\/eds-mesure-quantitative-des-elements-meb\/\">EDS Option &gt;<\/a><\/p>\n<p><a href=\"https:\/\/www.scientec.fr\/en\/produit\/plasma-cceaners\/\">Plasma Cleaner &gt;<\/a><\/p>\n<p><a href=\"https:\/\/www.scientec.fr\/en\/produit\/remote-plasma-cleaner\/\">Remote Plasma Cleaner &gt;<\/a><\/p>\n\n","protected":false},"excerpt":{"rendered":"<p>Scanning Electron Microscopes (SEM) Scanning Electron Microscopy (MEB in French or SEM in English for Scanning Electron Microscope) is an electron microscopy technique capable of producing 3-dimensional images of very high resolution on the order of a nanometer of the surface of a sample in using the principle of electron-matter interactions. &nbsp; The COXEM EM-30 [&hellip;]<\/p>\n","protected":false},"author":3,"featured_media":0,"parent":4409,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":{"0":"post-4415","1":"page","2":"type-page","3":"status-publish","5":"entry"},"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Scanning Electron Microscopes - Scientec<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.scientec.fr\/en\/surface-analysis\/scanning-electron-microscopes\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Scanning Electron Microscopes - Scientec\" \/>\n<meta property=\"og:description\" content=\"Scanning Electron Microscopes (SEM) Scanning Electron Microscopy (MEB in French or SEM in English for Scanning Electron Microscope) is an electron microscopy technique capable of producing 3-dimensional images of very high resolution on the order of a nanometer of the surface of a sample in using the principle of electron-matter interactions. &nbsp; 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