{"id":4413,"date":"2019-12-19T11:23:55","date_gmt":"2019-12-19T10:23:55","guid":{"rendered":"https:\/\/www.scientec.fr\/surface-analysis\/atomic-force-microscopes\/"},"modified":"2024-11-06T16:43:26","modified_gmt":"2024-11-06T15:43:26","slug":"atomic-force-microscopes","status":"publish","type":"page","link":"https:\/\/www.scientec.fr\/en\/surface-analysis\/atomic-force-microscopes\/","title":{"rendered":"Atomic Force Microscopes"},"content":{"rendered":"\n\n\t

Atomic Force Microscopes (AFM)
\n<\/h1>\n\tCSInstruments, manufacturer specializing in the design of atomic force microscopes, offers many solutions in AFM, such as Nano-Observer, the best performance \/ price AFM and, recently, the best set of AFM electrical measurements with the sMIM (Scanning Microwave Impedance Microscopy) system associated with the ResiScope II ( capable system measure resistance over 10 decades) and HD-KFM (one pass KFM optimized with higher sensitivity and resolution).
\nIn addition to this electrical measurement pack, CSInstruments also offers you different modes of environment such as temperature, liquid measurements or environmental control and AFM accessories (AFM tips … ).\n\t

CSInstruments<\/b><\/h2>\n

 <\/p>\n\t\t\t\t\n\t\t\t\t\"Afm-microscope\"\n\t\t\t\t<\/a>\n\t

The Nano-Observer is a compact and powerful AFM microscope with an all-in-one scanner (large and high resolution scans in a single scanner). In addition to the standard modes, you can have advanced modes and unique features such as HD-KFM, ResiScope, MLFM…<\/p>\n

 <\/p>\nNano-Observer AFM ><\/a>
\nNano-Observer II AFM ><\/a>
\n\n\t

Oxford Instruments<\/h2>\n

 <\/p>\n\t\t\t\t\"vero-afm-product-page-image3-white-bg-463x401\"\n\t

Oxford Instruments is a leading provider of high technology products<\/p>\n

 <\/p>\nMFP-3D Origin AFM ><\/a>
\nCypher S AFM Microscope ><\/a>
\nVero S: Interferometric AFM ><\/a>
\nJupiter XR AFM ><\/a>\n

 <\/p>\n\t

Galaxy Dual Controller
\nAFM compatible: 5100\/5500 \/ Multimode<\/h2>\n\t\t\t\t\n\t\t\t\t\"galaxy-dual-controller-csi\"\n\t\t\t\t<\/a>\n\t

The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance…<\/p>\n

 <\/p>\n

Galaxy Dual Controller ><\/a><\/p>\n

 <\/p>\n\t

Advanced<\/a>
\n<\/strong>electrical<\/a>
\n<\/strong>modes<\/a><\/strong>
\n<\/strong><\/h2>\n\t\t\t\t\n\t\t\t\t\"Microscope-afm-resiscope\"\n\t\t\t\t<\/a>\n\t1. HD-KFM : <\/strong>High Definition Kelvin Force Microscopy
\n<\/strong>2. ResiScope II : <\/strong>Current \/ Resistance over 10 decades
\n<\/strong>3. Soft ResiScope : <\/strong>ResiScope on delicate samples
\n<\/strong>5. sMIM : <\/strong>Permittivity and conductivity mapping at nm\n

 <\/p>\nMore information ><\/a>\n\t

AFM
\nMicroscopy
\nEnvironments\u00a0<\/a><\/h2>\n\t\t\t\t\n\t\t\t\t\"Fibroblastes\n\t\t\t\t<\/a>\n\t1. Environmental control: <\/strong>Gas, humidity
\n<\/strong>2. Liquid medium: <\/strong>No additional adjustment
\n<\/strong>3.Temperature control: <\/strong>From -35 \u00b0 C to 250 \u00b0 C
\n<\/strong>\n

 <\/p>\n

 <\/p>\n

 <\/p>\n

 <\/p>\n

 <\/p>\n

 <\/p>\n

More information ><\/a><\/p>\n\t

AFM
\nProbes<\/a>
\n<\/h2>\n\t\t\t\t\n\t\t\t\t\"Pointe\n\t\t\t\t<\/a>\n\t

Wide range of AFM probes<\/strong><\/p>\n– Contact
\n\n– No Contact
\n\n– Conductive
\n\n– EFM \/ MFM
\n\n– Diamand
\n\n– High resolution
\n\n

– Specific<\/p>\n

 <\/p>\n

\u00a0<\/strong>More information ><\/a><\/p>\n\n","protected":false},"excerpt":{"rendered":"

Atomic Force Microscopes (AFM) CSInstruments, manufacturer specializing in the design of atomic force microscopes, offers many solutions in AFM, such as Nano-Observer, the best performance \/ price AFM and, recently, the best set of AFM electrical measurements with the sMIM (Scanning Microwave Impedance Microscopy) system associated with the ResiScope II ( capable system measure resistance […]<\/p>\n","protected":false},"author":3,"featured_media":0,"parent":4409,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":{"0":"post-4413","1":"page","2":"type-page","3":"status-publish","5":"entry","6":"has-post-thumbnail"},"acf":[],"yoast_head":"\nAtomic Force Microscopes - Scientec<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.scientec.fr\/en\/surface-analysis\/atomic-force-microscopes\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Atomic Force Microscopes - 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Scientec\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.scientec.fr\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.scientec.fr\\\/en\\\/surface-analysis\\\/atomic-force-microscopes\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.scientec.fr\\\/en\\\/surface-analysis\\\/atomic-force-microscopes\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.scientec.fr\\\/wp-content\\\/uploads\\\/2019\\\/09\\\/afm-microscope.jpg\",\"datePublished\":\"2019-12-19T10:23:55+00:00\",\"dateModified\":\"2024-11-06T15:43:26+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.scientec.fr\\\/en\\\/surface-analysis\\\/atomic-force-microscopes\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.scientec.fr\\\/en\\\/surface-analysis\\\/atomic-force-microscopes\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.scientec.fr\\\/en\\\/surface-analysis\\\/atomic-force-microscopes\\\/#primaryimage\",\"url\":\"https:\\\/\\\/www.scientec.fr\\\/wp-content\\\/uploads\\\/2019\\\/09\\\/afm-microscope.jpg\",\"contentUrl\":\"https:\\\/\\\/www.scientec.fr\\\/wp-content\\\/uploads\\\/2019\\\/09\\\/afm-microscope.jpg\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.scientec.fr\\\/en\\\/surface-analysis\\\/atomic-force-microscopes\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Accueil\",\"item\":\"https:\\\/\\\/www.scientec.fr\\\/en\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Surface Analysis\",\"item\":\"https:\\\/\\\/www.scientec.fr\\\/en\\\/surface-analysis\\\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"Atomic Force Microscopes\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.scientec.fr\\\/#website\",\"url\":\"https:\\\/\\\/www.scientec.fr\\\/\",\"name\":\"Scientec\",\"description\":\"La SoluTion \u00e0 vos mesures\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.scientec.fr\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.scientec.fr\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.scientec.fr\\\/#organization\",\"name\":\"Scientec\",\"url\":\"https:\\\/\\\/www.scientec.fr\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.scientec.fr\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/www.scientec.fr\\\/wp-content\\\/uploads\\\/2018\\\/01\\\/scientec-slogan.png\",\"contentUrl\":\"https:\\\/\\\/www.scientec.fr\\\/wp-content\\\/uploads\\\/2018\\\/01\\\/scientec-slogan.png\",\"width\":6947,\"height\":1545,\"caption\":\"Scientec\"},\"image\":{\"@id\":\"https:\\\/\\\/www.scientec.fr\\\/#\\\/schema\\\/logo\\\/image\\\/\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Atomic Force Microscopes - Scientec","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.scientec.fr\/en\/surface-analysis\/atomic-force-microscopes\/","og_locale":"en_US","og_type":"article","og_title":"Atomic Force Microscopes - Scientec","og_description":"Atomic Force Microscopes (AFM) CSInstruments, manufacturer specializing in the design of atomic force microscopes, offers many solutions in AFM, such as Nano-Observer, the best performance \/ price AFM and, recently, the best set of AFM electrical measurements with the sMIM (Scanning Microwave Impedance Microscopy) system associated with the ResiScope II ( capable system measure resistance […]","og_url":"https:\/\/www.scientec.fr\/en\/surface-analysis\/atomic-force-microscopes\/","og_site_name":"Scientec","article_modified_time":"2024-11-06T15:43:26+00:00","og_image":[{"url":"https:\/\/www.scientec.fr\/wp-content\/uploads\/2019\/09\/afm-microscope.jpg","type":"","width":"","height":""}],"twitter_card":"summary_large_image","twitter_misc":{"Est. reading time":"3 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/www.scientec.fr\/en\/surface-analysis\/atomic-force-microscopes\/","url":"https:\/\/www.scientec.fr\/en\/surface-analysis\/atomic-force-microscopes\/","name":"Atomic Force Microscopes - Scientec","isPartOf":{"@id":"https:\/\/www.scientec.fr\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.scientec.fr\/en\/surface-analysis\/atomic-force-microscopes\/#primaryimage"},"image":{"@id":"https:\/\/www.scientec.fr\/en\/surface-analysis\/atomic-force-microscopes\/#primaryimage"},"thumbnailUrl":"https:\/\/www.scientec.fr\/wp-content\/uploads\/2019\/09\/afm-microscope.jpg","datePublished":"2019-12-19T10:23:55+00:00","dateModified":"2024-11-06T15:43:26+00:00","breadcrumb":{"@id":"https:\/\/www.scientec.fr\/en\/surface-analysis\/atomic-force-microscopes\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.scientec.fr\/en\/surface-analysis\/atomic-force-microscopes\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.scientec.fr\/en\/surface-analysis\/atomic-force-microscopes\/#primaryimage","url":"https:\/\/www.scientec.fr\/wp-content\/uploads\/2019\/09\/afm-microscope.jpg","contentUrl":"https:\/\/www.scientec.fr\/wp-content\/uploads\/2019\/09\/afm-microscope.jpg"},{"@type":"BreadcrumbList","@id":"https:\/\/www.scientec.fr\/en\/surface-analysis\/atomic-force-microscopes\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Accueil","item":"https:\/\/www.scientec.fr\/en\/"},{"@type":"ListItem","position":2,"name":"Surface Analysis","item":"https:\/\/www.scientec.fr\/en\/surface-analysis\/"},{"@type":"ListItem","position":3,"name":"Atomic Force Microscopes"}]},{"@type":"WebSite","@id":"https:\/\/www.scientec.fr\/#website","url":"https:\/\/www.scientec.fr\/","name":"Scientec","description":"La SoluTion \u00e0 vos mesures","publisher":{"@id":"https:\/\/www.scientec.fr\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.scientec.fr\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.scientec.fr\/#organization","name":"Scientec","url":"https:\/\/www.scientec.fr\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.scientec.fr\/#\/schema\/logo\/image\/","url":"https:\/\/www.scientec.fr\/wp-content\/uploads\/2018\/01\/scientec-slogan.png","contentUrl":"https:\/\/www.scientec.fr\/wp-content\/uploads\/2018\/01\/scientec-slogan.png","width":6947,"height":1545,"caption":"Scientec"},"image":{"@id":"https:\/\/www.scientec.fr\/#\/schema\/logo\/image\/"}}]}},"jetpack_sharing_enabled":true,"_links":{"self":[{"href":"https:\/\/www.scientec.fr\/en\/wp-json\/wp\/v2\/pages\/4413","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.scientec.fr\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.scientec.fr\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.scientec.fr\/en\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/www.scientec.fr\/en\/wp-json\/wp\/v2\/comments?post=4413"}],"version-history":[{"count":3,"href":"https:\/\/www.scientec.fr\/en\/wp-json\/wp\/v2\/pages\/4413\/revisions"}],"predecessor-version":[{"id":5749,"href":"https:\/\/www.scientec.fr\/en\/wp-json\/wp\/v2\/pages\/4413\/revisions\/5749"}],"up":[{"embeddable":true,"href":"https:\/\/www.scientec.fr\/en\/wp-json\/wp\/v2\/pages\/4409"}],"wp:attachment":[{"href":"https:\/\/www.scientec.fr\/en\/wp-json\/wp\/v2\/media?parent=4413"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}