Surface analysis products, AFM, electrical measurement, profiler, optical, méchanical, AFM probes, Nano-Indentation,SNOM, FESEM
Surface analysis
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Scanning Electron
Microscopy
Scanning Probe
Microscopy 
2D/3D optical profilometry
Vacuum Technology

Coxem

- EM-30AX Plus

- EM-30AX

- EM-30 Plus

- EM-30

- CX-200TM

- CX-200TA

- Ion Coater (SEM sample)

- EDS Options

CSInstruments

- Nano-Observer AFM

- ResiScope II current and resistance measurements


Nanonics

- Microscopy SNOM

 

Accessoires

- AFM Probes

KLA Tencor

- Interferometry


Toho Technology

-Stress measurement

Sensofar

- Interferometry

- Interferometry/confocal

- Inspection stents


Lyncee Tec

- 3D dynamic holography
- Wafer inspection

- MemsTool
- Réfléctomètre

 

Filmetrics

- Optical profilometer


Accessories

- Calibration standards

 

Prevac

- Ultra High Vacuum systems

- Manipulators, goniometer...

- Chamber
- Sample holders

- Instruments

- Accessories
- Electronics

- Software

 

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Mechanical
Profilometry
Nano-Indentation
Thin film
Spectroscopy

KLA Tencor

- Profilometer

- Simulator stylus / channels


Toho Technology

- Profilometer large sample

 

Accessories

- Calibration standards

Nanomechanics

- In-Situ Indentation

- Nano-Indenter iNano (ambient)

- Nano-Indenter iMicro

- Nano-Indenter (Ambient&Vacuum)


KLA Tencor

- Nano-Indenter G200

- T150 UTM

- NanoSuite

 


Filmetrics

- Spectrale measurement

- Measurement of thickness

- Optical constant

Anasys Instruments (Infra-Red)

- mIRage (sub-µm IR spectroscopy)

 

S&I (Raman)

- Monovista

- Triple-spectrometer