Systems for measuring thin film

F50

Thin-film thickness and n&k are mapped quickly and easily with the F50 advanced spectral reflectance system. The motorized R-0 stage moves automatically to selected measurement points and provides thickness measurements in seconds....

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Systems for measuring thin film

F20

Thickness and optical constants (n and k) are measured quickly and easily with the F20 advanced spectrometry system...

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F40

This system is designed to measure thickness by using the light collection optic of a microscope. Due to the extreme angle of the cone of light, it is designed to measure thickness...

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