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Scanning probe

CSInstruments
Nano-Observer AFM
ResiScope current and resistance measurements


Nanonics
Microscopy SNOM

AFM Accessories
AFM Probe

Scanning Electron
Microscopy

 

• Coxem
• EM-30AX Plus
• EM-30AX
• EM-30 Plus
• EM-30
• CX-200TM
• CX-200TA
• Ion Coater
• EDS Options

Spectroscopy

Photothermal spectroscopy corp (Infra-red)

mIRage (Sub-µm IR spectroscopy)

S&I (RAMAN)

Monovista

Triple-Spectrometer

Optical Profilometry

• KLA Tencor
• Interferometer
  
• Toho Technology
• Stress measurement
  
• Sensofar
• Interferometer
• Interferometer/ confocal
• Inspection of stents
  
• Lyncee Tec
• DHM
• Wafer inspection
• MemsTool
• Reflectometer
  
• Filmetrics
• Optical profilometer
  
• Accessories
• Calibration standards
  

Mechanical
Profilometry

 

• KLA Tencor
• Profilometer
  
• Toho Technology
• Profilometer large sample
  
• Accessories
• Calibration standards

NanoIndentation

Nanomechanics
In-Situ Indenter
Nano-Indenter iNano
Nano-IndenteriMicro
Nano-Indenter (ambient & Vacuum

KLA Tencor
Nano-Indenter G200
T150 UTM
NanoSuite

Thin films

Filmetrics
Spectrale measurement
Measurement of thickness
Optical constant

Vacuum Technology

Prevac
Ultra High Vacuum systems
Manipulators, goniometer...

Chamber
Sample holders
Instruments
Accessories
Electronics
Software

Photometry - Colorimetry - Radiometry

 

Konica Minolta
Luxmeter
Luxmeters/ Chromameters
Photometers/ chromameters
Spectro-radiometers
Videocolorimeters
Screen Analyzers
Photometers

Gooch & Housego
Photometers radiometers
Light source
Spectroradiometers

Technoteam
2D Photometer
Video-photometers
Video-
colorimeters

Jeti
Spectroradiometers
Spectroradiometers UV


Sedis
Photogoniometer

Services

Rental
Training
Calibration
After-sales service