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Scanning probe

CSInstruments
Nano-Observer AFM
ResiScope current and resistance measurements


Nanonics
Microscopy SNOM

AFM Accessories
AFM Probe

Scanning Electron
Microscopy

 

• Coxem
• EM-30AX Plus
• EM-30AX
• EM-30 Plus
• EM-30
• CX-200TM
• CX-200TA
• Ion Coater
• EDS Options

Spectroscopy

Photothermal spectroscopy corp (Infra-red)

mIRage (Sub-µm IR spectroscopy)

S&I (RAMAN)

Monovista

Triple-Spectrometer

Optical Profilometry

• KLA Tencor
• Interferometer
  
• Toho Technology
• Stress measurement
  
• Sensofar
• Interferometer
• Interferometer/ confocal
• Inspection of stents
  
• Lyncee Tec
• DHM
• Wafer inspection
• MemsTool
• Reflectometer
  
• Filmetrics
• Optical profilometer
  
• Accessories
• Calibration standards
  

Mechanical
Profilometry

 

• KLA Tencor
• Profilometer
• Simulator stylus / channels
  
• Toho Technology
• Profilometer large sample
  
• Accessories
• Calibration standards

NanoIndentation

KLA Tencor
In-Situ Indenter
High Temperature
Nano-Indenter iNano
Nano-IndenteriMicro
Nano-Indenter (ambient & Vacuum
Nano-Indenter G200
T150 UTM
NanoSuite

Thin films

Filmetrics
Spectrale measurement
Measurement of thickness
Optical constant
InLine/ In-Situ

Vacuum Technology

Prevac
Ultra High Vacuum systems
Manipulators, goniometer...

Chamber
Sample holders
Instruments
Accessories
Electronics
Software

Photometry - Colorimetry - Radiometry

 

Konica Minolta
Luxmeter
Luxmeters/ Chromameters
Photometers/ chromameters
Spectro-radiometers
Videocolorimeters
Screen Analyzers
Photometers

Optronic Laboratories
Photometers radiometers
Light source
Spectroradiometers

Technoteam
2D Photometer
Video-photometers
Video-
colorimeters

Jeti
Spectroradiometers
Spectroradiometers UV


Sedis
Photogoniometer

Services

Rental
Training
Calibration
After-sales service