Pointes AFM AppNano

AFM Probes

porbes

 

 

afm probes

AppNano Probes are compatible with most commercially avaible SPMs. These probes are nano-fabricated using highly doped single crystal silicon with unparalleled reproductibility, robustness and sharpness for consistent high resolutionimaging capabilities.

Many models are available. Standard Contact / Tapping Mode probe, Standard Electric Force mode probe, Force Modulation Standard probe mode, Standard Mode Non-Contact/Tapping probes.

For more information contact ScienTec : afm.probes@scientec.fr

Probes guide



 

FORT, ACT, ACL & ACST Series - Non-contact

FORT probes are medium frequency silicon probes designed for tapping / non-contact mode applications. These probes have a medium spring constant that make them ideally suited for Force Modulation Microscopy.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
FORT
R, G, A, SS*
1,6
61
6nm (<10nm)

 

ACT probes are silicon probes designed for tapping / non-contact mode applications. These probes feature a short cantilever.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
ACT
R, G, A, SS*
37
300
6nm (<10nm)

 

ACL silicon probes are designed for tapping / non-contact mode applications. These probes feature a long, thin cantilever that allows for greater laser clearance than our standard ACT model.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
ACL
R, G, A, SS*
58
190
6nm (<10nm)

 

ACST probes are silicon probes designed for non-contact or soft tapping mode applications. These probes are reasonably soft with a mid-range resonance frequency. ACST-SS probes have a super sharp tip, and ACST-TL are tipless.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
ACST
R, G, A, SS*
7,8
150
6nm (<10nm)

* Shape : V - for V shape ; R - for Rectangular
* Reflex Coating : G fo Gold ; A for Aluminium
* Tip & Reflex Coating : PtIr for Platine Iridium . Cr-Co for Chrome Cobalt
*Aspect : SS for SurperSharpsharp

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ANSCM Series - EFM/ KFM/ CAFM/ ResiScope

ANSCM probes are silicon probes with a thin layer of Pt/Ir coating on both reflex and tip sides of the probes. These probes are ideal for Electrical Force Microscopy (EFM) and Kelvin Force Microscopy (KFM) applications, and are available for use in CAFM mode.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
ANSCM
PtIr*
37, 2.7, 0.29
300, 60,
12
30nm


* Tip & Reflex Coating : PtIr for Platine Iridium



More types of probes

 

Doped Diamond Series - CAFM/ ResiScope


Doped Diamond Probes offer a unique combination of hardness and conducting tip. They are specially designed for electrical measurements based on contact mode. The tip side of these probes is coated with polycrystalline diamond. The diamond film is in-situ doped with boron to make it highly conducting. The reflex side of the cantilever is coated with Aluminum. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility and robustness. ...

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
Doped
Diamond
A*
37, 1.6, 0.29
300, 61, 15
100-300nm

* Reflex Coating : A for Aluminium


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MAGT Series - MFM


MAGT probes are silicon probes specially designed for Magnetic Force Microscopy (MFM) applications. Both reflex and tip sides have a layer of magnetic coating. Our MAGT probes vary in coercitivity and moment to match different MFM requirements....

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
MAGT
Cr-Co*
2,7
61
40nm
MAGT-LM
Cr-Co*
2,7
61
25nm
MAGT-HM
Cr-Co*
2,7
61
75nm

* Tip & Reflex Coating : PtIr for Platine Iridium . Cr-Co for Chrome Cobalt


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HYDRA-All Series - Contact


HYDRA-ALL Series probes are designed primarily for imaging soft samples in contact or for force-distance applications, but can also be used for imaging samples in non-contact / tapping mode in liquid. Hydra-All probes have 4 V-shaped cantilevers on one chip with differents spring constant....

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
Hydra-All
G*
0,292, 0.045, 0.405, 0,081
66,17,67
<10nm

* Reflex Coating : G fo Gold ; A for Aluminium


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ACCESS-C™ Series - Contact/ Non-Contact


ACCESS probes are used in contact and non-contact and allow a direct optical view. They compensate the deflection angle for dimensional measurements.
These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging.
..

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
ACCESS-C
A*
0,3
16
<10nm
ACCESS-NC
78
300
<10nm
ACCESS-FM
2.7
60
<10nm

* Reflex Coating : A for Aluminium

 

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