NanoIR2-s

NanoIR2-S

The only nanoscale IR spectroscopy and imaging platform with both: AFM-IR + S-SNOM

 

 


 

AFM-IR

True model-free IR absorption spectroscopy

s-SNOM

Sub-20 nm complex optical property imaging

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Life sciences - Polymers - Organics

Graphene - 2D materials - Photonics - Inorganics

 

 

 

s-SNOM: Unparalleled imaging of nano-optical phenomena


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s-SNOM is a universal probe of light-matter interactions at the nanoscale. It is a powerful technique for mapping complex optical properties and phenomena of materials with nanometer scale spatial resolution.


s-SNOM: How it works


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The s-SNOM technique uses a metallized AFM tip to enhance and scatter radiation from a nanometer scale region of the sample. The scattered radiation is detected in the far field, but it carries information about the complex optical properties of the nanoscale region of the sample under the metallized tip. Specifically, both the optical amplitude and phase of the scattered light can be measured. With appropriate models, these measurements can estimate the complex optical constants (n, k) of the material under the tip. In some cases, the optical phase versus wavelength provides an approximation to a conventional absorption spectrum. The s-SNOM technique works best on hard materials, especially those with high reflectivity, high dielectric constants, and/or strong optical resonances.

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s-SNOM: Now from the world leader in AFM-based spectroscopy :


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The Anasys Instruments nanoIR2-s builds on a heritage of technology leadership in AFM-based nano-optical characterization tools. Designed with an unmatched level of performance, integration, automation, and flexibility, the nanoIR2-s sets a new standard for research productivity and ease of use.

 


nanoIR2-s innovations:

  • Exclusive technology enables rapid spectroscopy and imaging with a single tunable laser source at speeds >10X faster than spatio-spectral imaging (pat. pending)
  • Patented adaptive beam steering and all reflective optics enables broad wavelength compatibility while eliminating realignment and refocusing at different wavelengths
  • Patented dynamic power control maintains optimal power and signal over broad range of sources, wavelengths and samples
  • Patented suppression of unwanted background scattered light that otherwise corrupts measurements of complex optical properties
  • High NA focusing/collecting optics with full 25 mm diameter clear aperture through interferometer provides excellent light collection and superior signal to noise ratio
  • Computer controlled source interface module supports multiple sources, including tunable and broadband lasers and synchrotron beamlines
  • Modular and flexible optical design is readily adaptable to future experiments
  • Pre-mounted probes and motorized tip, sample and source alignment eliminates tedious steps in probe installation and re-optimization

 

s-SNOM point spectroscopy


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Exclusive technology enables rapid spectroscopy and imaging with a single tunable laser source at speeds >10X faster than spatio-spectral imaging

 

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Optical spectroscopy and imaging with s-SNOM. Point spectrum of s-SNOM gives complex optical property of the sample (top right), with both amplitude and phase of scattered light from interferometric detection (top left). s-SNOM phase image of a defect on-resonance and off-resonance (bottom).

 

hBN phonon-polaritons snom Nano imaging of surface phonon polaritons (SPhP) on hexagonal boron nitride (hBN). (a) AFM height image shows homogeneous hBN surface with different layers on Si substrate; (b) s-SNOM amplitude shows strong interference fringes due to propagating SPhP along the surface on hBN; (c) s-SNOM phase shows a difference phase with layer thickness. From the image b and c, we can also see the wavelength of the SPhP changes with the number of layers.

Graphene plasmonics

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s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. (left) s-SNOM phase with a line cross-section of the SPP standing wave; (right) s-SNOM amplitude. Top image is a 3D view of Phase image (left).

 

Life sciences

snom s-SNOM measurements of purple membrane reveal distribution of protein within the lipid membrane. AFM height (top); s-SNOM phase image with IR source tuned to the amide I absorption band (bottom left); s-SNOM phase image off-resonance (bottom right).

 


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